Materials Engineer (EN-MME-MM-2024-133-LD)
CERN
Geneva, GENEVA, Switzerland
14 дней назад
... such as light microscopy, Scanning Electron Microscopy (SEM), including Focused Ion ... characterization techniques such as Scanning Electron Microscopy (SEM), Energy Dispersive X-ray analysis (EDS), Electron Backscatter Diffraction (EBSD), Focused Ion ...
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